Scanning
Probe
No matter the surface complexity, the Scanning Probe automatically acquires data points along user-defined start and end points for fast and reliable inspection of intricate features.
Continuous Contact for Constant Data Collection
The Scanning Probe stands out with its continuous contact scanning capability, offering rapid data collection from surfaces with large or small contour variations. It’s also your ideal choice for measuring the form of virtually any feature orientation.
Stylus range
20 - 50mm
50 - 105mm
120 - 200mm
Stylus type
Ball
Ball material
Tungsten, ruby or delrin
Mounting
Fixed position offset from the optics
Change rack
3 or 6-position
Compatible machines
Book your
in-person demo
Book a free demo at our Advanced Innovation Centre where you can see the Scanning Probe in action to witness how it can be incorporated into measurement routines.
Download the full specifications
Get the full technical data on the Scanning Probe today. Discover the key data points, applications and technical specifications by downloading the brochure.
